There are many different authors put methods and different techniques have been made in determining the thickness of the material. Shirakawa Y. (2000), Beck et al (1978) and Jonas Boson et al (2008) study of a material thickness in the transmission method. Manpreet Singh et al (2006, 2007) were used compton scattering method in the study of the source material thickness 137Cs (661.5keV). In addition, some authors have applied the method Monter Carlo (MCNP, Geat, ...) and in combination with the experimental values to study the thickness of the material. [Xizhang Chen ett al (2015), Huy (2007)].
In this work we apply the method to determine the peak to valley thickness of materials. We describe the experimental use MCNP6 thickness determines the thickness of aluminum copper material. Thereby, we evaluate analytical techniques peak to valley and transmission method in determining the sensitivity of the material thickness. Peak to valley method for determining the results of the sensitivity of the material thickness changes better than the transmission method.
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